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Jim Phillips (brainfiller)
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Post subject: Device setting changes due to arc flash study  Posted: Sun Nov 14, 2010 6:26 pm |
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Joined: Mon Sep 17, 2007 5:00 pm
Posts: 1736
Location: Scottsdale, Arizona
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Have you made any permanent device setting changes due to the results of an arc flash study?
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Jim Phillips, P.E.
Brainfiller.com
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Gary B
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Post subject: Posted: Wed Dec 29, 2010 9:01 pm |
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Joined: Thu Oct 18, 2007 7:10 pm
Posts: 262
Location: NW USA
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Yes, and at one location we found many, many inconsistencies, left as a legacy to many previous engineers all having different philosophies. It was amazing and only due to good luck that the plant was not experiencing continuous expensive outages. I point to this as a money saving benefit achieved thru arc flash study.
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haze10
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Post subject: Posted: Thu Jan 13, 2011 9:44 am |
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Joined: Thu Jan 10, 2008 8:49 pm
Posts: 520
Location: New England
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Yes, at the facility I am at now, we added Inst trip to switchgear breakers which previously only had short time. Based upon fault current, we set the Inst to trip at 80% of expect fault. This actually led to us losing coordination with down stream devices. However, we collectively felt that the benefits of day to day low IE levels on our MCCs, outwayed the 1 in 10 year event of one large motor that couldn't be coordinated and would trip to switchgear breaker on a bolted fault.
All of life is a compromise!
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